Showing results: 706 - 720 of 990 items found.
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Gamma Scientific Inc.
Gamma Scientific offers a variety of pre-configured integrating sphere systems for use in conjunction with the UDT line of optical meters, with both 25 mm and 150 mm diameters.
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NANOSTAR -
Bruker Optics
In fact, the NANOSTAR analyzes pure sample properties, even for non-isotropic sample systems. The modular design permits setting the detector-to-sample distance from 11.5 mm up to 1070 mm. Hence, the entire range from SAXS to WAXS can be covered in combination with the Image Plate (IP) option simultaneously.
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X-eye 9000LED -
SEC Co., Ltd.
X-ray Tube100kV / 200uAMin. Resolution5µmTable Size1,500mm X 500 mmDetectorFlat Panel Detector (High sensitivity)Dimension3,620(W) x 1,065(D) x 1,590(H)mm / 850kg
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BBS-VH -
Summit
The 'True' Black Body - Range 500 to 1300°C, Resolution 1°C, Accuracy <0.3% reading, Stability ±0.5°C, Aperture Ø 25 mm, Emissivity better than 0.99, Semi-Portable
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HG-C -
Panasonic Industrial Devices Sales Company of America
Housed in a lightweight but strong die-cast aluminum case, the compact HG-C Series pairs a highly precise CMOS Image Sensor with a newly designed optical system to achieve a smaller Sensor depth, as well as, highly accurate measurements in the order of 1/100 mm (0.0003 In.).
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111FFE6012-012X -
ELMA Electronic, Inc.
the VME form factor extender 6U 120 mm allows to adapt boards for use in the same VMEbus system. It maintain the correct depth dimensions and allow the front panel to be aligned.
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484V2-E09L-30PA1-100 -
ELMA Electronic, Inc.
CompactPCI Serial System Type 12 with 9 Slots, Slot on the left side of the system platform. 1x 300W pluggable, air-cooled with fan fix-mounted and colorless chromated. Vertical backplanes and have a 160mm card cage in the front and a 80mm rear I/O.
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116FFE6018-0125R -
ELMA Electronic, Inc.
the VME64x form factor extender 6U 180 mm without P0 allows to adapt boards for use in the same VMEbus system. It maintain the correct depth dimensions and allow the front panel to be aligned.
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350C and 350CD -
Scitec Instruments Ltd
Model 350 is a high stability variable frequency optical chopper. The basic system consists of a control unit and a chopping head. It is supplied with four chemically blacked 30 mm diameter discs. These discs are of 2, 4, 10 and 40 slots and allow operation over the frequency range 10 Hz to 10 kHz.
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DLAP-211-Nano -
ADLINK Technology Inc.
*Deep learning acceleration with NVIDIA® Jetson Nano™*Compact fanless system 148(W)x120(D)x49.1(H)mm*Wide temperature range from -20°C to 70°C
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Hildebrand Prüf- und Meßtechnik GmbH
The MICRO IRHD SYSTEM provides hardness readings on elastomers according to MICRO IHRD. Recommended specimen thickness is 1 to 5 mm. It complies to international standards such as DIN ISO 48, ISO 48 and ASTM D 1415.
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MP-265 / MPC-365 -
Sutter Instrument Company
The MP265/M mechanical builds on our existing manipulator line in several ways. First, the narrow format means more manipulators can be grouped around a recording chamber. Next, the narrow format MP-265/M allows a high precision manipulator to be inserted into small spaces in existing setups. Finally, travel in the Y-axis is shortened (12.5 mm) both to economize on width and because radially oriented manipulators do not require long travel in the traverse axis.
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Geotek Ltd.
The Geotek Multi-Sensor Core Logger (MSCL) systems enable a suite of geophysical measurements to be obtained rapidly, accurately and automatically on sediment or rock cores. The rugged nature of the equipment makes it suitable for use in either an onshore laboratory/repository environment or onboard survey and drilling vessels. All of Geotek’s core loggers accept core between 50 mm and 150 mm in diameter and up to 1.55 m in length. Geological cores and materials come in a variety of sizes therefore the MSCL and X-ray CT systems are designed for a full range of core material in a variety of liner compositions. To accommodate varying customers’ requirements (both operational and scientific), we provide a range of different core loggers and X-ray CT systems:
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DLAP-201-JT2 -
ADLINK Technology Inc.
*Deep learning acceleration with NVIDIA® Jetson™ TX2*Compact fanless system 148(W)x105(D)x50(H)mm*Wide temperature range from -20°C to 70°C
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FilmTek 6000 PAR-SE -
Scientific Computing International
Production-proven metrology system for film thickness, refractive index and stress measurement for a broad range of film layers at the 1x nm design node and beyond. Accommodates 200 or 300 mm wafer metrology. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to meet the challenging demands associated with multi-patterning and other leading-edge device fabrication techniques.